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CONDUCTIVE PROBE

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CONDUCTIVEPROBE
申请(专利号：JP19950352974
专利号：JPH09184852A主分类号：G01R1/06
申请权利人：NHKSPRINGCO
LTD公开国代码：JP优先权国家：JP
摘要：
PROBLEMTOBESOLVED:Toreducetheinductanceandresistanceofasemiconductorsocket.SOLUTION:Asemiconductorelementsocket1is
constitutedbyassemblinganelasticcoilconductor3intoaninsulatingplate2.Acoilnearlywoundonetimeisextendedinanaxialdirectioninthecoilconductor3.Bothendpartsofthecoilconductor3arekeptintouchwithaconductiveball5asaterminalsecurelyfixedtoalowerfaceofasemiconductor4bysolderingorthelikemannerandaterminalpattern7setataconfrontingsubstrate6.Attheusingtime,thesemiconductor4andsubstrate6arefixedat,apositionwhereapartofthecoilconductor3extendingfromtheinsulatingplate2isbenttoacertaindegree.Sincethecoiliswoundapproximatelyonetimeinalongitudinaldirection,acurrentdoesnotrotateapluralityofnumberoftimesintameshapeofacoil,butflowsinanearlystraightstate.Accordingly,the
deteriorationofaninductancewhenthe
申请日：1995-12-28公开公告日：1997-07-15
分类号：G01R1/06;
G01R1/04;G01R31/26;H01R13/11发明设计人：KAZAMATOSHIO申请国代码：JP
优先权：19951228JP
35297495
摘要附图：

coiliswoundapluralityofnumberoftimesispreventedappropriatelyandatotallengthisshortenedtherebyreducingaresistance.主权项：
【請求項1】コイル状をなす導電体を絶縁性支持体により貫通状態に支持すると共に、前記導電体の前記絶縁体から延出する部分を1巻き以下にし、かつ前記絶縁体内を通る導電経路を1巻き以下にしたことを特徴とす

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